Research > Surfaces Low-energy electron-energy loss spectroscopy (EELS)We use EELS to study elementary electronic excitations in insulators. The information is then used to characterize defects and radiation damage in insulators such as metal oxides, polymers, diamond, and ice. Example: Phys. Rev. B, Rapid Comm. 6312 (2001) 1101.The work on diamond and oxide films is done in collaboration with Argonne National Laboratory. Example: Appl. Phys. Lett. 86 (2005) 042904.
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Contact Info: LASP, University of Virginia, Thornton Hall, 351 McCormick Road, P. O. Box 400238 Charlottesville, VA 22904-4238, U. S. A. | Phone: 434-924-1059 |