Surface Science Center


We have the ability to modify the surface layers of materials by ion implantation and to do surface characterization and depth profiling of sample composition with a Perkin-Elmer 560 system. The available techniques are:

Each of these techniques can be combined with the others and with sputter etching (using a differentially pumped ion gun) to obtain composition depth profiles.


We provide services on surface analysis.

Please contact Cathy Dukes  to discuss your application by phone (804-924-1059), fax (804-924-1353) or e-mail cdukes@virginia.edu. cathy2.gif (10343 bytes)

Useful information


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Updated January 20, 2005 by R. A. Baragiola