We have the ability to modify the surface layers of materials by ion implantation and to do surface characterization and depth profiling of sample composition with a Perkin-Elmer 560 system. The available techniques are:
Each of these techniques can be combined with the others and with sputter etching (using a differentially pumped ion gun) to obtain composition depth profiles.
We provide services on surface analysis.
| Please contact Cathy Dukes to discuss your application by phone (804-924-1059), fax (804-924-1353) or e-mail cdukes@virginia.edu. |  |
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