Surface Science Center

We have the ability to modify the surface layers of materials by ion implantation and to do surface characterization and depth profiling of sample composition with a Perkin-Elmer 560 system. The available techniques are:

• Angle-resolved X-Ray Photoelectron Spectroscopy (XPS or ESCA)
• Scanning Auger Electron Microscopy with micron resolution
• Ion Scattering Spectroscopy (ISS or LEIS)
• Electron energy loss spectroscopy (EELS)
• Ultraviolet Photoelectros Spectroscopy (UPS)
• Secondary Ion Mass Spectrometry (SIMS)

Each of these techniques can be combined with the others and with sputter etching (using a differentially pumped ion gun) to obtain composition depth profiles.

We used to provide surface analysis services but we do not do that any more.  Rather, we can collaborate in joint research projects where we perform surface analysis.

Please contact Cathy Dukes  to discuss a potential collaboration by phone (434-983-8756) or e-mail cdukes@virginia.edu

Useful information

• Particle-solid interactions Web Server
• The Periodic Table
• Physical Constants

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