Nanoscale Materials Characterization Facility – NMCF is located in the Department of Materials Science and Engineering (MSE) in the School of Engineering and Applied Science (SEAS) at the University of Virginia (UVa) is a state-of-the-art facility dedicated to microscopy and microanalysis of materials from atomic to microscopic levels. The center has three transmission electron microscopes (TEMs), two scanning electron microscopes (SEMs), a focused Ga+ ion beam (FIB) microscope, extensive hardware/software for image simulation, processing and analysis, and a variety of specimen preparation equipment. More detailed information about the microscopes and capabilities is provided below. Some of the capabilities include:
- Atomic imaging of materials with 0.17 nm point resolution
- Elemental analysis of regions 0.5-1.0 nm in diameter
- Elemental mapping and energy-filtered imaging
- Dynamic experiments utilizing heating, cooling and straining holders
- Orientational mapping of materials
- Microstructural engineering, characterization, imaging and modification of surfaces
- Computer acquisition and processing of images and spectra
The Nanoscale Materials Characterization Facility is available for use by all qualified faculty, students and researchers at UVa, as well as by researchers from other universities and industries. Scheduling is handled on a first-come first-serve basis by our web-based sign-up system. A technician, students and faculty are available to assist researchers using the instruments, and two 3-credit courses in electron microscopy are offered each year. At any given time, the facility is typically used by about half of the faculty and students in MSE, as well as by several researchers from other departments in the School of Engineering and Applied Science, Physics, Biology, and from nearby universities and industries.
