| Conventional TEM studies are performed on a JEOL 2000FXII 200kV TEM equipped with a LaB6 filament, high-angle PGT EDXS detector, Gatan slow-scan and wide-angle TV-rate cameras and a variety of specimen holders, including heating, cooling and straining stages with tilting capability. This instrument has a high-tilt pole-piece with a point resolution of 0.3 nm and ± 60° double-tilt capability using the Gatan low-background double-tilt holder. The SSC on the 2000FXII is connected to a Quadra 840AV for image acquisition and analysis. X-ray spectra are analyzed using a 4PI system. |
