A JEOL 4000EX 400 kV top-entry high-resolution TEM (HRTEM) with a LaB6 filament is also available. This microscope may be configured with one of two objective lens pole-pieces, either an ultrahigh-resolution pole-piece with 0.17 nm point resolution and ± 20° tilit, or a high-resolution double-tilt ( ±10°) hot-stage (25-800°C) with 0.18 nm point resolution. The higher accelerating voltage and better point-resolution of this microscope make it preferable to the 2010F for many HRTEM and in situ hot-stage experiments. The 4000EX has a TV-rate camera that is connected to a VCR and to a Quadra 950AV computer with Digital Micrograph software for in situ recording and image analysis, respectively.
Experimental and simulated (inset) HRTEM images of the coherent interface between TiAl (gamma) and Ti3Al (alpha-2) phases in a TiAl-base alloy.