NanoScale Materials Characterization Facility

FEI Quanta 650 Scanning Electron Microscope

quanta 650

Room: Wilsdorf Hall B001

- In-situ analysis of diverse samples on large stage
- Capable of ambient temperatures from -165°C to 1400°C
- Surface imaging with optional beam deceleration
- Characterize conductive and non-conductive samples with
- EDS and EBSD analysis

FEI Quanta LV200 Scanning Electron Microscope

fei quanta 200

Room: Wilsdorf Hall B001

- S/TEM detector for bright-field and dark-field sample imaging
- Automated stage control, accommodates large specimens
- easy set up and control